Major record microcircuits working condition inherent thermal radiation

Currently mass-produced by electronic equipment components based hybrid circuit , integrated microcircuits and multi-layer printed circuit board so requires improved testing methods miniature . Due to the current in the development and production of microcircuits used in quality inspection method is not able to find some defects , especially some internal injury . Therefore, the hope of a new approach that primarily records microcircuits working condition inherent thermal radiation. Current  Voltage stabilizer  of a thermal imaging device an infrared scanning microscope activity model to test stick together , integrated microcircuits and  Circuit breaker  circuit board . Its main components are: the optical head on the table with the coordinates of the object to study units, the control section ,  circuit breakers  section , the power console , auto body parts and electrical code conversion , with power and temperature control part of the standard radiator . Hope satin commission by two spherical child training , punctuality decision bajia mounted lens composition of the work , its spectral range of 3 ~ G micron , magnification day twenty-one 10 times and a numerical aperture of 0.6 . Used by the receiver to 77OK indium antimonide infrared detectors , sensitive area of ​​75 x75 microns. The input window of the detector 5 is a mechanical chopper M, given the target of the infrared radiation flux fixed modulation frequency.